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Inverted Laser Scanning Confocal Microscopy (LEICA TCS SP8X STED)

	Proposal(Please use the CGMH internet)
	Publications
	Instrument Manager
	Name：Chih-Chun Chen
	Mei-Ling Huang
	Yu Chang
	Number：(03)3281200#7706

1.	Technical principle
2.	Facility Specifications
	I.	Type：Leica TCS SP8X STED
	II.	Light source：
		i.	Visible laser
			A.	White light laser system: pulsed laser
			B.	Super continuous exciting range: 470nm-670nm
			C.	1nm adjustable
			D.	>mW for each wavelength
		ii.	UV laser
			A.	405nm laser
			B.	50mW
	III.	Microscope：LEICA DMi8 Inverted microscope 1set
	IV.	Objective lens：
		i.	Plan Fluotar 5x, dry, NA 0.15, WD≧13.7mm
		ii.	Plan APO 10x, dry, NA 0.40, WD≧2.2mm
		iii.	Plan APO 20x, NA 0.70, coverglass, WD≧0.59mm
		iv	Plan APO 40x, oil, NA 1.30, WD≧0.24mm
		v	Plan APO 63x, oil, NA 1.40, WD≧0.14mm
		vi	Plan APO 63x, glyc, NA 1.30, CORR, WD≧0.3mm
		vii	Plan APO 93x, glyc, NA 1.30, motC STED WLL , WD≧0.3mm
		viii	Plan APO 100x, oil, NA 1.40, STED WHITE , WD≧0.09mm
	V.	Scanner：
		i.	for UV/405 nm-VIS-IR-gSTED with 4 independent laser ports
		ii.	Light gate FLIM technology
		iii.	High resolution scan mode:
			A.	Scan field of view(FOV) at least 22 mm, speed 7fps@512x512 in FOV 22mm, 84fps @ 512 x 16
			B.	Max. scan resolution 8192 x 8192, 16 bits grey scale, digitalization 12bits or 18 bits.
	VI.	CCD：
		i.	1.4 Mpixel (1392 x 1040)
		ii.	Exposure time 4us-10min
	VII.	Image capture format：
		i.	Bright field
		ii.	Fluorescence
		iii.	Reflection
		iiii.	Normaski differential interference contrast (DIC)
	VIII.	Build-in Scanner' confocal detector：
		Multi-band Spectrophotometer（400-850 nm）with 4PMT tube (2 cooling hybrid GaAsP/APD detectors + 2 cooled PMT detectors)
	IX	3D STED module
		i.	592nm STED laser
		ii.	660nm STED laser
		iii.	775nm STED laser
		iv.	Resolution dxy~30nm, dz<100nm
		v.	3D STED device
	X	Incubation system
	XI	Software：
		i.	Leica Application Suite X
		ii.	Imaris 3D/4D real time image software
		iii.	Metamorph image analysis software